A method to determine coating’s Young’s modulus from frequency shift of silicon cantilevers

Document #:

JGW-G1201266-v2

Document type:

G

Submitted by:

Riccardo DeSalvo

Updated by:

Riccardo DeSalvo

Document Created:

09 Sep 2012, 17:09

Contents Revised:

10 Sep 2012, 00:40

Metadata Revised:

10 Sep 2012, 00:40

Abstract:

The Young's modulus of coatings is needed to precisely calculate their thermal noise, one of KAGRA's limiting factors.
A method to measure it is presented here

Files in Document:

• LVC-Frequency of silicon cantilever of 3&19layers nan...pptx (1.6 MB)

Topics:

• Detector:Optics
• Management:Conference:LVC
• Activity:KAGRA

Authors:

• Riccardo DeSalvo

Keywords:

coatings nanolayers

Approved for use in external presentations:

Unapproved